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AFM Gauges Atom Charge State

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ZURICH, June 15, 2009 – IBM scientists in collaboration with the University of Regensburg, Germany, and Utrecht University, Netherlands, for the first time demonstrated the ability to measure the charge state of individual atoms using noncontact atomic force microscopy. Measuring with the precision of a single electron charge and nanometer lateral resolution, researchers succeeded in distinguishing neutral atoms from positively or negatively charged ones. This represents a milestone in nanoscale science and opens up new possibilities in the exploration of nanoscale structures and devices at the ultimate atomic...Read full article

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    Published: June 2009
    Glossary
    atomic force microscope
    An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few nanometers in diameter) over the surface of a sample at a very close distance. The tip interacts with the sample's surface forces, providing detailed information about the sample's topography and properties at the nanoscale. Key features and principles of...
    photonics
    The technology of generating and harnessing light and other forms of radiant energy whose quantum unit is the photon. The science includes light emission, transmission, deflection, amplification and detection by optical components and instruments, lasers and other light sources, fiber optics, electro-optical instrumentation, related hardware and electronics, and sophisticated systems. The range of applications of photonics extends from energy generation to detection to communications and...
    AFMatomic force microscopeatomic-scale scienceBasic ScienceBiophotonicscharge state of individual atomsIBMIBMs Zurich Research LaboratoryMicroscopynanometer lateral resolutionneutral atomsNews & Featuresnoncontact atomic force microscopyphotonicsscanning tunneling microscopesSensors & DetectorsSTMUniversity of RegensburgUtrecht University

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