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Ametek Acquires Imago

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PAOLI, Pa., April 21, 2010 — Ametek Inc. has acquired Imago Scientific Instruments, a privately held manufacturer of 3-D atom probes, for an undisclosed amount. "Imago Scientific Instruments significantly broadens our technical capabilities in differentiated, high-end analytical instrumentation and is an excellent addition to our Cameca advanced elemental analysis business," said Frank S. Hermance, Ametek’s chairman and CEO. Ametek makes electronic instruments and electromechanical devices and has annual sales of $2.1 billion. "Imago is a pioneer in the development of 3-D atom probe technology, which is...Read full article

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    Published: April 2010
    Glossary
    electron probe microanalysis
    An analytical technique used to determine the nature of extremely small samples by forming the x-ray spectrum of the samples through excitation by a finely focused electron beam.
    electronics
    That branch of science involved in the study and utilization of the motion, emissions and behaviors of currents of electrical energy flowing through gases, vacuums, semiconductors and conductors, not to be confused with electrics, which deals primarily with the conduction of large currents of electricity through metals.
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    AmericasAmetek Inc.Ametek Ultra Precision Technologiesanalytical instrumentationatom probesBasic ScienceBiophotonicsBusinessCamecaelectron probe microanalysiselectronicsenergyenvironmental scienceEPMAforensic scienceFrank S. HermanceImagingImago Scientific InstrumentsindustrialLEXESlow-energy x-ray emission spectrometrymaterials sciencemetallurgymetrologyOptoformPennsylvaniapetrochemistrypharmaceuticalsPrecitechR&Dsecondary ion mass spectrometrySIMSSolartron MetrologyspectroscopySterling Ultra PrecisionTaylor HobsonTest & Measurementx-ray fluorescence spectrometry

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