!%Jasco Inc.%! has released a downloadable three-page document that describes its Irtronμ sample compartment microscopy system, which is compatible with the company’s FT/IR-4000 and -6000 series Fourier transform IR spectrometers. It notes that the accessory installs into the spectrometer sample compartment in seconds without optical alignment and that the optical design provides high throughput for sensitive measurements of samples approaching 20 μm. The full-color publication includes graphs depicting transmission measurement using the mercury-cadmium-telluride and deuterated L-alanine triglycine sulphate detectors. Optional accessories such as a purge casing, a pressure sensor and attenuated total reflectance objectives are listed.