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SPIE Optical Metrology 2011: Call for Papers

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CARDIFF, England, Nov. 9, 2010 — New research in optical measurement technologies enabling applications in industry, research modeling, inspection of nanostructures and artwork, and related topics will be presented at SPIE Optical Metrology 24 to 26 May 2011. The conference will be held at the International Conference Centre Munich in conjunction with Laser World of Photonics. SPIE Optical Metrology is the field’s premier conference in Europe for scientists, engineers, researchers, and applications or product developers, noted symposium chairs Wolfgang Osten, Universiteit Stuttgart; Malgorzata Kujawinska,...Read full article

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    Published: November 2010
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    nano
    An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
    3-D measurementAmericasapplications developerarchaeologyarchitectureartAsia-PacificBernd BodermannBusinessCardiffconservationengineerEOSEPSEuropeEuropean Optical SocietyEuropean Physical SocietyFabio RemondinoFondazione Bruno KesslerGerman Scientific Laser Society/Wissenschaftliche Gesellschaft LasertechnikIEEE Photonics SocietyImagingimaging sensorindustrialindustrial designindustrial inspectionIndustry EventsInternational Conference Centre MunichIstituto di Fisica Applicata Nello CarraraIstituto Nazionale di Ottica ApplicataKassel UniversityLaser World of Photonics CongressLuca PezzatiMalgorzata KujawinskaMark ShortisMelbournemetrologynanonanostructureoptical measurementOptical Society of AmericaOpticsOSAPeter LehmannPhysikalisch-Technische BundesanstaltPietro Ferraroproduct developerproduction engineeringrange sensorReno Salimbeniresearch modelingResearcherRMIT UniversityscientistSensors & DetectorsSPIE Digital LibrarySPIE Optical MetrologyTest & MeasurementUniversity of StuttgartWalesWarsaw University of TechnologyWLTWolfgang OstenLasers

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