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II-VI Acquires Max Levy

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SAXONBURG & PHILADELPHIA, Pa., Dec. 14, 2010 — Crystal growth technology company II-VI Inc. announced the acquisition of Max Levy Autograph Inc. (MLA), a maker of microfine conductive mesh patterns for optical, mechanical and ceramic components for applications in circuitry, metrology, target calibration and suppression of electromagnetic interference (EMI). Financial terms were not disclosed. At its 30,000-sq-ft. facility in Philadelphia, the MLA team of research and manufacturing engineers has developed technologies that utilize electro-forming and plating and microfine diamond contouring for precision patterns on various...Read full article

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    Published: December 2010
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    optical
    Pertaining to optics and the phenomena of light.
    aircraftAmericasBusinessceramic componentsceramicscircuitrycrystal growthdefenseDonald SedberryEEOelectro-formingelectro-magnetic interferenceEMIExotic Electro-Optics Inc.Francis KramergriddingII-VI Inc.industrialintelligenceland vehiclesMax Levy Autograph Inc.mechanical componentsmergersmetrologymicrofine conductive mesh patternsmilitaryMilitary & MaterialsMLAopticalOpticsplatingreconnaissancesurveillancetarget calibrationLasers

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