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DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

How to Evaluate a Measurement Application’s Requirements

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C.W. "Ron" Swonger, Coherix Inc.

Precision noncontact metrology application factors can seem complicated, especially when 3-D or multispectral measurements are involved. Here’s how to ensure a robust and otherwise optimized metrology solution for your application. The competing requirements for the most challenging measurement applications in industry and other technical endeavors can be daunting when their complexity takes the design or application engineer into territory that is “uncharted” in his or her experience. This is especially the case when 3-D high-precision measurement or sensitive...Read full article

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    Published: April 2012
    Glossary
    bidirectional reflectance distribution function
    Unified notation for specification of reflectance in terms of both incident- and reflected-beam geometry; i.e., the ratio of reflected radiance in direction toward the viewer to the irradiance in direction toward a portion of the source.
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    3-D3-sigmabidirectional reflectance distribution functionBRDFC.W. SwongerCoherix Inc.dimensionsFeaturesindustrialinspectionlocal artifactlocal defectmeasurement throughputmetrologymultispectralprecision noncontact metrologyRon SwongerSensors & Detectorssurface finishTest & Measurement

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