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Rudolph Acquires NanoPhotonics

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FLANDERS, N.J., June 22, 2012 — Rudolph Technologies Inc., a maker of process control metrology systems used in semiconductor device manufacturing, has acquired NanoPhotonics GmbH of Mainz, Germany, the company announced Thursday. The deal will strengthen its presence in the high-growth advanced packaging market, Rudolph said. While specific terms of the deal were not disclosed, Rudolph said the all-cash transaction used less than 5 percent of its cash on hand, which totaled almost $174 million at the end of March 2012. The acquisition "expands our product offerings into unpatterned wafer and mask blank...Read full article

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    Published: June 2012
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    nano
    An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
    accretiveacquisitionsadvanced packagingAmericasback-end manufacturingBusinesschip-to-chipdealEuropefront-end manufacturingGermanyindustrialmask blank inspectionmetrologynanoNanoPhotonics GmbHNew JerseyPaul McLaughlinRudolph Technologiessemiconductor inspectionsemiconductor manufacturingsurface inspectionTest & Measurementtransactionwafer-level packaging

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