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Laser Cooling Enhances Atomic-Force Microscopy

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CANBERRA, Australia, Aug. 19, 2014 — Cooling nanowire probes with lasers could lead to significant improvements in the sensitivity and resolution of atomic-force microscopes. The technique, developed by a team from Australian National University, uses lasers to achieve a broadband multimode cooling of a nanowire probe of -23 dB to 8±1 K (about -265 °C). This technique could make such microscope probes 20 times more sensitive and capable of detecting forces as small as the weight of an individual virus, the researchers said. They reported a room temperature force measurement sensitivity of <2 ×...Read full article

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    Published: August 2014
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    nano
    An SI prefix meaning one billionth (10-9). Nano can also be used to indicate the study of atoms, molecules and other structures and particles on the nanometer scale. Nano-optics (also referred to as nanophotonics), for example, is the study of how light and light-matter interactions behave on the nanometer scale. See nanophotonics.
    AFMAsia-Pacificatomic force microscopyAustralian National UniversitymetrologyMicroscopynanoResearch & TechnologyBen BuchlerGiovanni GuccioneHarry SlatyerLasers

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