Search
Menu
Gentec Electro-Optics Inc   - Measure With Gentec Accuracy LB

Quantum Effect Between Object and Probe Could Enable Higher Resolution AFM

Facebook X LinkedIn Email
A novel technique, dubbed quantum atomic force microscopy, has the potential to significantly enhance the spatial, spectral and temporal resolution of AFM for nanometrology of materials. Researchers at Oak Ridge National Laboratory (ORNL) have introduced the concept of a quantum-mechanical modality that capitalizes on squeezed states of probe displacement. The technique tracks the minute interactions between the probe of the microscope and the surface of the sample to locate the precise point where quantum effects stabilize the probe, resulting in more sensitive measurements. When...Read full article

Related content from Photonics Media



    Articles


    Products


    Photonics Handbook Articles


    White Papers


    Webinars


    Photonics Dictionary Terms


    Media


    Photonics Buyers' Guide Categories


    Companies
    Published: May 2017
    Glossary
    metrology
    Metrology is the science and practice of measurement. It encompasses the theoretical and practical aspects of measurement, including the development of measurement standards, techniques, and instruments, as well as the application of measurement principles in various fields. The primary objectives of metrology are to ensure accuracy, reliability, and consistency in measurements and to establish traceability to recognized standards. Metrology plays a crucial role in science, industry,...
    quantum
    The term quantum refers to the fundamental unit or discrete amount of a physical quantity involved in interactions at the atomic and subatomic scales. It originates from quantum theory, a branch of physics that emerged in the early 20th century to explain phenomena observed on very small scales, where classical physics fails to provide accurate explanations. In the context of quantum theory, several key concepts are associated with the term quantum: Quantum mechanics: This is the branch of...
    Research & TechnologyAmericasmetrologymicrocscopyquantumatomic force microscopyAFMORNLSensors & Detectors

    We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.