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Scattered Light Finds Defects in Wires

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Daniel Woolls

Physicists in Spain and Argentina have developed a laser-based system designed to let makers of thin metallic wires detect and assess surface defects without shutting down the assembly line. The technique monitors the cone of light that is scattered from a wire when it is illuminated obliquely. Wires with diameters of 50 to 2000 µm are found in everything from semiconductors to automobile air bags. Scratches, grooves, holes and other imperfections that wire can develop during manufacture can change its physical and chemical properties, so identifying such glitches is key to...Read full article

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    Published: September 2000
    Basic ScienceindustrialMicroscopyResearch & TechnologyTech Pulse

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