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Atomic Force Microscopes

An atomic-force microscope is a type of microscope that produces a quantitative, three-dimensional image of the surface of a sample. The surface is scanned by an extremely sharp tip mounted to a flexible cantilever. The atoms on the tip interact with the atoms on the surface of the sample, causing a deflection of the cantilever; this deflection is monitored and used to generate the image.

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Mad City Labs Inc.

Madison, WI
Stock Manufacturer
Designs and manufactures piezo nanopositioning systems and nanoscale precision instruments for metrology, photonics, astronomy, and microscopy. Closed loop nanopositioners with low noise, high stability PicoQ sensors. Products include piezo nanopositioners, single molecule microscopes, high precision micropositioning, AFM, and custom design.

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Bruker Nano Surfaces, Div. of Bruker Corp.

Tucson, AZ
Supplier/Distributor
Extensive suite of application-focused instrumentation for life sciences and materials research and production covers the full range of metrology techniques, sample sizes, and imaging resolutions. Technologies include AFMs, NanoIR spectrometers, fluorescence microscopes, stylus and optical profilers, mechanical testers, and nano-indenters.

Innova

Dimension FastScan Bio

Dimension FastScan

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Average Number of Employees: 131

The Photonics Buyers' Guide is a comprehensive resource for verified providers of Atomic Force Microscopes. Profiles and contact information for manufacturers and suppliers are provided by the companies and verified by our editors. If you have updated information about any of the organizations listed, please contact us.

Glossary

atomic force microscope An atomic force microscope (AFM) is a high-resolution imaging and measurement instrument used in nanotechnology, materials science, and biology. It is a type of scanning probe microscope that operates by scanning a sharp tip (usually a few...

AFMthree-dimensional image3-D image3D imageflexible cantileverdeflectionmicroscopyimagingscientific

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