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Scanning Electron Microscopes (SEM)

A scanning electron microscope is an electron microscope that uses a beam of electrons -- accelerated to high energy and focused on the sample -- to scan the sample surface, ejecting secondary electrons that form the picture of the sample.

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Glossary
  • scanning electron microscope An electron microscope that uses a beam of electrons -- accelerated to high energy and focused on the sample -- to scan the sample surface, ejecting secondary electrons that form the picture of the sample.
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