Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
Photonics Dictionary

differential interference contrast microscopy

Differential interference contrast (DIC) microscopy, sometimes called Nomarski Microscopy after the inventor Georges Nomarski, is one of several methods used to obtain microscope images of transparent objects. In DIC, the illumination source is divided into two orthogonally polarized beams using a birefringent prism in the objective. These are made to pass through the sample with a deliberate slight lateral offset (shear). They are recombined in a second Nomarski prism. Interference then converts any phase differences in the two beams into intensity differences in the combined image. The final image contrast depends on the phase difference between the two beams, which depends in turn on the thickness and refractive index of the sample. DIC does not indicate absolute sample thickness. Rather, the contrast is roughly proportional to the thickness gradient, which is typical of shear-type imaging methods.

Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2017 Photonics Media
x We deliver – right to your inbox. Subscribe FREE to our newsletters.