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THIN-FILM MEASUREMENT

Photonics Spectra
Dec 2001
Aquila Instruments Ltd.Request Info
 
A thin-film measuring instrument for applications in optical coating, telecommunications devices and semiconductors has been released by Aquila Instruments Ltd. The nkd 7000 simultaneously measures transmitted and reflected light from the same area on a sample using a nondestructive method. The measurement chamber is enclosed, preventing contamination and false readings caused by stray light. The hardware, software and electronics are integrated within the compact tabletop unit, which uses a standard PC and Windows operating system.


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