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FTIR IMAGING

Photonics Spectra
Jan 2002
PerkinElmer Instruments
 
Designed to complement imaging techniques such as scanning electron microscopy, the Spectrum Spotlight 300 features Duet detector technology that eliminates the need for step-scan data collection and that operates over a wide wavelength range. PerkinElmer Instruments says its imaging system reduces analysis time from hours to minutes. It features Fourier transform infrared (FTIR) microscopy capabilities, faster imaging, advanced graphics and a simple setup. An integrated suite of software tools enables identification of small differences in chemical content and provides information about defects, impurities and composition from all sample types.


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