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THIN-FILM MEASUREMENT

Photonics Spectra
Mar 2004
Quad Group Inc.Request Info
 
Available through Quad Group Inc. is Hong Ming Technology's MFS-630-F optical system, which can measure the properties of thin films nondestructively. The cost-effective device employs laser interferometry to facilitate the measurement of thickness, refractive index and extinction coefficient. Spectral analysis of reflections from the top and bottom interfaces of the films provides thickness and optical constants (n and k) in seconds, according to Quad Group. The system includes a miniature CCD spectrometer, a reflection probe, a manual X-Y-stage, a light source, lens assemblies and FilmSmart software. Applications include the measurement of optical coatings and flat panel and semiconductor thin films.


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