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SPECTROMETER

LTB Lasertechnik Berlin GmbHRequest Info
 
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Lasertechnik Berlin GmbH has developed the Elias III spectrometer jointly with the Institute for Spectrochemistry and Applied Spectroscopy Berlin. The echelle device quantitatively analyzes the wings and spectral vicinity of the laser lines and measures a minimum linewidth of 20 fm FWHM at 193 nm. It is suitable for spectral characterization of 248-, 193- and 157-nm excimer lasers in microlithography, and for atom absorption spectroscopy and laser diode development.


Published: November 2004
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atom absorption spectroscopyBasic Scienceindustriallaser diode developmentLasertechnik Berlin GmbHmicrolithographyNew ProductsSpectrometerspectroscopy

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