Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

PLµ 2300 OPTICAL IMAGING PROFILER

Photonics Spectra
Jan 2005
Sensofar MetrologyRequest Info
 
PLµ 2300 Optical Imaging ProfilerSensofar-Tech SL of Terrassa (Barcelona), Spain, a spinoff company founded in 2001 from the Technical University of Catalonia, has launched an optical imaging profiler that measures from the same head using three techniques: confocal microscopy, and phase-shift and vertical scanning interferometry. The user simply chooses the appropriate objective on the nosepiece, selects the objective and the right technique on the software, and focuses the sample.

The PLµ 2300 was developed using a proprietary arrangement based on high-power LED illumination and microdisplay technology. The confocal arrangement's main advantages are the high light efficiency of the illumination hardware and the high-contrast algorithms. The confocal technique measures steep slopes, samples containing dissimilar materials, and rough and low-reflective surfaces; the phase-shift and the vertical-scanning interferometry techniques are suitable for measuring smooth surfaces, including those with large fields of view.

The compact and robust system contains no moving parts and weighs 4.5 kg. It is modular and suitable for standard laboratory configurations and for OEM integrated applications for production and quality control. The instrument achieves 70° slopes on smooth surfaces, 12:1 aspect ratios, centimeter-scale profiles and 0.1-nm repeatability measurements.

Applications include microelectromechanical systems, optics and micro-optics, semiconductors, integrated circuits and materials testing, biotechnology and thickness measurements.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to Sensofar Metrology by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
MORE FROM PHOTONICS MEDIA
confocal microscopyMicroscopyNew Productsoptical imaging profilerSensofar-Tech SLvertical scanning interferometry

Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x Subscribe to Photonics Spectra magazine - FREE!
X
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to Sensofar Metrology so they may respond to your inquiry directly.

Email Address:
Name:
Company:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.