X-Y STAGES
OptoSigma Corp.Request Info
OptoSigma Corp. has announced the integration of its linear X-Y stages into a high-resolution scanning curvature and stress measurement system produced by k-Space Associates Inc. The kSA MOS Ultra-Scan is an ex situ tool that maps the induced thin-film stress on semiconductor wafers, optical mirrors, lenses and most polished surfaces. The stages were integrated to provide flexibility and accuracy in the 2-D laser system, which provides an X-Y scanning range of 200 mm with a resolution of 2 µm.
https://www.optosigma.com
/Buyers_Guide/OptoSigma_Corp/c11150
Published: August 2005
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:
When you click "Send Request", we will record and send your personal contact information to OptoSigma Corp. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our
Privacy Policy and
Terms and Conditions of Use.
Register or login to auto-populate this form:
Login
Register
* Required