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SCAN HEAD

Photonics Spectra
Dec 2005
Asylum ResearchRequest Info
 
SCAN HEAD Asylum Research has introduced the MFP-3D extended scan head for use with its MFP-3D atomic force microscopy systems. The scan head contains an extra piezo stack that enables an increased scan range of 28 µm along the Z-axis for samples with high features, and for such bioscience applications as live-cell and plant imaging, and for pulling on long-chained molecules. It incorporates the company’s nanopositioning sensors, which provide a Z-sensor noise of <0.3 nm Allan deviation (Adev) and a Z-height noise of <0.06 nm Adev in a bandwidth from 0.1 Hz to 1 kHz. Sensor nonlinearity is <0.2% (Adev/full travel) at full scan.


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Asylum Researchatomic force microscopy systemsBasic ScienceMicroscopyNew Productsscan headSensors & Detectors

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