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AFiS Systems

Photonics.com
Mar 2006
Nanometer Technologies Inc.Request Info
 
The AFiS systems (AfiS Sr., AfiS Jr. Plus, AfiS Jr.) are superior scratch detection systems that fully automate your visual inspection of connectors. AFiS can quickly and accurately -- regardless of fiber orientation -- detect defects smaller than a single micron on fiber ends. Nanometer Technologies' proprietary inspection software detects defects by performing a contrast-based analysis, or mapping, of a captured image of the fiber end, or surface of the connector, providing a robust and sophisticated graphical user interface. The AfiS systems are designed to create highly detailed inspection reports for statistical process control (SPC), to streamline production, for tracking purposes and to send quality-control reports with a customer’s order. Data can be sorted by customer, date, job, serial number, polishing fixture, etc. This unit will decrease inspection time of connectors (while also reducing human subjectivity) and will supply statistical analyses that will help improve yields and overall production quality.


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