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INDENTERS

Photonics Spectra
Sep 2006
Asylum ResearchRequest Info
 
Asylum Research_nanoindentor4.jpgAsylum Research has released the NanoIndenter module to complement its MFP-3D atomic force microscope. Unlike cantilever-based indenters, the device drives the tip perpendicular to the sample. It enables measurement of tip displacement and force via the microscope’s optical detector and proprietary NPS nanopositioning sensors. Suitable for studying dislocation phenomena, fractures in ceramics, and the mechanical behavior of metals, thin films, bone and other biomaterials, and polymers, the module enables repeatable imaging, feature measurement, quantitative force curves and imaging offsets. It is available in standard and low-force models, and it comes with small, medium and large sample mounts.


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Asylum ResearchBasic ScienceMicroscopyNanoIndenter modulenanopositioning sensorsNew ProductsSensors & Detectors

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