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IN SITU SURFACE MAPPING

Photonics Spectra
Sep 1998
Surface Optics Corp.Request Info
 
Surface Optics Corp. has unveiled a field-portable reflectometer for mapping the bidirectional reflectance distribution function (BRDF) of surfaces whose removal to a lab would alter their reflectance properties or harm the equipment. The model SOC-250 can measure the BRDF of surfaces from the visible to the infrared by using an assortment of interchangeable sources, spectral bandpass filters and detectors available in two instrument configurations: one for the visible to near-IR and one for the mid-IR.


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