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JSM-7001F Analytical SEM
Mar 2007
JEOL USA Inc.Request Info
PEABODY, Mass., March 13, 2007 -- The JSM-7001F, a new thermal field-emission analytical scanning electron microscope (SEM) from electron optical product maker JEOL USA, acquires high-resolution micrographs at up to 1,000,000X magnification for applications ranging from semiconductors, metals, minerals, materials and ceramics to nonconductive biological samples.

JEOL-JSM-7001F.jpgThe JSM-7001F features a unique in-lens field emission gun that delivers more than 200 nA of beam current to the sample. An extremely small probe diameter at low kV and high current is optimal for characterization of nanostructures with a resolution of 1.2 nm at 30 kV. According to JEOL, the JSM-7001F is ideal for low accelerating voltage x-ray spectroscopy and crystallography at and below the 100-nm scale.

The large specimen chamber -- designed for samples up to 200 mm in diameter -- accommodates a wide variety of detectors simultaneously. These include multiple EDS, WDS, EBSD, scanning transmission electron microscope (STEM), BSE, CL, EBIC, and infrared camera. The SEM can also be equipped as a dual-column focused ion beam or an electron-beam lithography tool.

The SEM comes with a choice of three stage sizes and exchange chambers, and a new 5-axis automated stage. The JSM-7001F can be configured for both high-vacuum and low-vacuum operation.

A new Windows XP-based computer interface allows for unprecedented ease of operation and image analysis. Users can choose to display up to four live images on the screen, as well as live signal mixing.

As with all electron optics products sold at JEOL USA, four days of training at the JEOL Institute in Peabody, Mass. are included in the purchase of the JSM-7001F, allowing the new user to optimize performance of this instrument for their applications.

For more information, visit:; e-mail:

11 Dearborn Rd.
Peabody, MA 01960
Phone: (978) 535-5900
Fax: (978) 536-2205


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