Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
Email Facebook Twitter Google+ LinkedIn

MultiBeam SEM-FIB System
Nov 2007
JEOL USA Inc.Request Info
For Micromilling and High-Res SEM Imaging
PEABODY, Mass. Nov. 29, 2007 -- JEOL USA Inc. said its new high-throughput JIB-4500 MultiBeam SEM-FIB (scanning electron microscope, focused ion beam) combines the high-resolution imaging of the JEOL LaB6 electron column with real-time micromilling and monitoring capability.

The MultiBeam is a high-productivity tool for integrated circuit defect analysis, circuit modification, TEM (transmission electron microscope) thin-film sample preparation, and mask repair.

JEOLMultiBeam.jpgA versatile all-in-one system, the MultiBeam features serial slicing and sampling (S3) for in-process monitoring of milling, fabrication, and reconstructing 3-D images of the sectioned area. A maximum milling current of 30 nA ensures high throughput milling of large areas.

Additional features include low vacuum operation for nonconductive specimens without coating or alteration, a gas injection system for etching and deposition, a large stage for up to 150-mm samples, and a multiple port design for a range of analytical needs. Samples are loaded through a standard airlock system.

JEOL USA said it has formed partnerships with the University of Southern California and Boston College and that MultiBeam systems will be delivered to each school's new nanoimaging lab in early 2008.

For more information, visit:; e-mail:

11 Dearborn Rd.
Peabody, MA 01960
Phone: (978) 535-5900
Fax: (978) 536-2205


* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address 2:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to JEOL USA Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
analysisdefectdepositionetchingimagingintegrated circuitJEOL LaB6JEOL USAJIB-4500micromillingMicroscopyMultiBeamnanonanoimagingphotonicsProductsSEM-FIBTEMtransmission electron microscope

Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA,

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to JEOL USA Inc. so they may respond to your inquiry directly.

Email Address:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.