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Atomic Force Microscope
Feb 2009
Veeco Instruments Inc.Request Info
PLAINVIEW, N.Y., Feb. 10, 2009 – Veeco Instruments Inc. has released its Dimension Icon atomic force microscope (AFM). Building upon a large-sample platform, the microscope delivers high resolution, ease-of-use and fast time-to-results.

It is designed to address the needs of both the research lab and industrial applications. Users can perform analysis ranging from quantitative automated characterization to atomic scale imaging in materials science, semiconductor, data storage and energy research applications.Veeco_Icon.jpg

Many of the microscope’s features were engineered specifically to enhance technical performance and to increase usability and productivity for both new and expert AFM users. The system uses an X-Y-Z closed-loop head that scans at high speeds while delivering low drift and low noise. These features combine to decrease stabilization time, enabling the rapid acquisition of artifact-free data.

A high-resolution camera and integrated feedback alignment tools deliver fast probe positioning and sample navigation, allowing users to more easily locate features of interest. And the redesigned software offers intuitive work flow and default experiment modes that distill advanced AFM processes into preconfigured settings.

For more information, visit:

Veeco Instruments Inc.
Terminal Drive
Plainview, N.Y. 11803
Phone: (516) 677-0200
Fax: (516) 677-0380


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AFMatomic force microscopeatomic scale imagingBasic ScienceBiophotonicsDimension Iconenergy research applicationsfast probe positioningindustrialMaterial SciencemicroscopeMicroscopyphotonicsProductsquantitative automated characterizationsemiconductorVeeco Instruments

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