Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

Flexible Workstation

Photonics.com
Mar 2009
Carl Zeiss Ltd.Request Info
 
PEABODY, Mass., March 26, 2009 – Carl Zeiss SMT has introduced its Auriga CrossBeam focused ion beam/scanning electron microscopy (FIB/SEM) workstation. To characterize samples on the nanometer scale, it performs chemical analysis and provides complete morphology and crystallographic and electrical information.

Zeiss_Workstation.jpgThe workstation has a redesigned vacuum chamber that includes 15 ports for different detectors. The charge compensation system enables local application of an inert gas flush so that electrostatic charging of nonconductive samples is neutralized, and detection of secondary and backscattered electrons is possible. Such analytical methods as energy dispersive spectroscopy, electron backscatter diffraction and secondary ion mass spectrometry benefit from this technology, supporting numerous applications in materials analysis, life sciences and semiconductors.

At the heart of the workstation is the Gemini field-emission SEM column. Its in-lens detector produces images with good material contrast, and the design of the column enables analysis of magnetic samples. The system performs simultaneous milling and high-resolution SEM imaging, and it incorporates a high-resolution FIB with a top level resolution of 2.5 nm or better. Advanced gas processing technology for ion- and electron-beam-assisted etching and deposition completes the sample processing capabilities.

The system can be upgraded to meet changing needs.

For more information, visit: www.smt.zeiss.com

Carl Zeiss SMT
1 Corporation Way
Peabody, MA 01960
Phone: (978) 826-1500



REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to the supplier by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
15-port vacuum chamberAurega CrossBeamBiophotonicsCarl Zeisscharge compensation systemelectron-beam-assisted etchingfocused ion beam/scanning electron microscopy workstationion-beam-assisted etchinglife sciencesmaterials analysisMicroscopynanometer characterizationphotonicsProductssemiconductorsSensors & Detectorsspectroscopy

Terms & Conditions Privacy Policy About Us Contact Us
back to top

Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
X
Are you interested in this product?
When you enter your email address and click "Send Request", we will send your contact details to Carl Zeiss Ltd. so they may respond to your inquiry directly.

Email Address:
Stop showing me this for the remainder of my visit