ABERRATION-CORRECTED STEM
JEOL USA Inc.Request Info
JEOL USA Inc. has unveiled an atomic resolution scanning transmission electron microscope (STEM). The 200-kV aberration-corrected JEM-ARM200F analytical microscope achieves high-angle annular dark-field resolution of 0.08 nm. It enables atom-by-atom imaging resolution and high spatial resolution for atom-to-atom chemical mapping of materials. The shielding design protects the ultrahigh-power optics from airflow, vibration and acoustical interference, and additional shielding protects against electronic interference, magnetic fields and thermal fluctuations.
https://www.jeolusa.com
/Buyers_Guide/JEOL_USA_Inc/c7365
Published: May 2009
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