Force microscopy
Oxford Instruments Asylum ResearchRequest Info
Asylum Research Corp. has introduced the Piezo Force Module for use with its MFP-3D atomic force microscope. Consisting of a high-voltage amplifier as well as high-voltage cantilever and sample holders, the device enables piezoresponse force microscopy measurements with a programmable bias of up to ±220 V with a 30-V/μs slew rate. The module comes with software for four imaging and two spectroscopy applications, including dual-frequency resonance tracking and single-point hysteresis loop measurements. The instrument provides crosstalk-free measurements on biological systems in fluids.
http://AFM.oxinst.com
/Buyers_Guide/Oxford_Instruments_Asylum_Research/c1206
Published: February 2008
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