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CLEM control

Jan 2007
Nikon Instruments Inc.Request Info
Nikon.jpgNikon Instruments Inc. has unveiled a controlled-light-exposure microscopy unit for the Nikon C1 confocal microscope system. The control unit uses two laser confocal imaging methods to optimize the laser excitation and detector sensitivity range, resulting in fewer photobleaching effects and less saturation of the detector signals. It calculates the fluorescent integration signal and exposure time for each pixel in real time, performs acoustic-optic modulator high-speed shutter control and high-speed operation processing based on the amount of acquired fluorescence signal and then outputs the resulting signal to the C1 controller’s line grabber electronics circuit.


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BiophotonicsBreakthroughProductsCLEM controlcontrolled-light-exposure microscopy unitMicroscopyNikon Instruments Inc.Sensors & Detectors

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