Search
Menu
Videology Industrial-Grade Cameras - Custom Embedded Cameras LB 2024

ORCA-Flash2.8 Camera

Hamamatsu CorporationRequest Info
 
Facebook X LinkedIn Email
BRIDGEWATER, N.J., March 18, 2010 – Hamamatsu Corp.’s ORCA-Flash2.8, a digital camera based on a scientific CMOS image sensor, is designed for low-light imaging at high frame rates.

The FL-280 sensor features 2.8 megapixels and a pixel size of 3.63 × 3.63 µm. Wavelength sensitivity ranges from the UV to the visible, with peak sensitivity and >60% quantum efficiency at ~450 to 500 nm. Typical readout noise is 3 electrons rms, even at fast readout speeds.

Producing low dark current, it requires cooling to only 5 °C. The camera’s readout speed ranges from 45 fps at full resolution to 1273 fps with subarray readout. Features include external trigger, real-time corrections and analog gain. The camera is designed for quantitative measurements with 12-bit output, and it interfaces with a PC via the included Camera Link frame grabber.

Applications include ratio imaging; Förster resonance energy transfer, fluorescence in situ hybridization and total internal reflection fluorescence microscopy; real-time confocal microscopy; semiconductor inspection; and industrial imaging.


Published: March 2010
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Hamamatsu Corporation by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

cameras12-bit outputAmericasanalog gainBiophotonicsCamera LinkCMOSconfocal microscopydigital cameraexternal triggerFL-280fluorescence in situ hybridizationFörster resonance energy transferhamamatsuImagingindustrialindustrial imagingMicroscopyORCA-Flash2.8Productsratio imagingreal-time correctionssemiconductor inspectionSensors & Detectorstotal internal reflection fluorescenceUV-Vis

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.