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FTIR microscope

Nov 2006
JASCO Inc.Request Info
Jasco Inc.’s Irtronμ sample compartment microscopy system is designed for the analysis of microscopic samples with the benefits of an external Fourier transform infrared microscope accessory. For use with the company’s FT/IR-4000 and -6000 series spectrometers, the device integrates quickly without the necessity for optical alignment. Transmittance, reflectance and attenuated total reflectance measurement modes and several detector choices enable measurement of samples as small as 20 μm. Powder and liquid sample compartments allow users to measure a variety of samples without removing the microscope accessory.


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