Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

InTouchScope SEM

Photonics.com
Sep 2010
JEOL USA Inc.Request Info
 
PEABODY, Mass., Sept. 28, 2010 — The InTouchScope scanning electron microscope (SEM) from JEOL USA Inc. features a multitouch interface. The analytical, low-vacuum instrument features integrated energy dispersive spectroscopy analysis with the latest silicon drift detector technology.

It has the feel of today’s personal electronic media. The intuitive multitouch screen interface puts all SEM apps at the operator’s fingertips. The user can expand windows and images with the sweep of two fingers, dial in magnification and focus with a swipe, and select operating parameters, analytical functions, or measure distances just by tapping the PC or notebook touch screen.

Functions include automatic SEM condition setup based on sample type; simultaneous multiple live image and movie capture; easy sample navigation at 5× to 300,000× magnifications; quantitative and qualitative elemental analysis; low- and high-vacuum operation; and wireless capability.

High-vacuum resolution at 20 kV is 4 nm, at 3 kV, 8 nm, and at 1 kV, 15 nm. Low-vacuum resolution is 5 nm at 20 kV. Acceleration voltage is from 0.5 to 20 kV, and operating temperature is from -10 to 90 °C.

The company says that the microscope features all the capabilities of a full-size tungsten SEM in a small, ergonomic and intuitive design. An onboard turbo pump makes this a self-contained, portable SEM that is easy to set up anywhere in the laboratory.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to JEOL USA Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
Americasautomatic setupEDsenergy dispersive spectroscopyergonomichigh-vacuumimagingInTouchScopeJEOLlive image capturelow-vacuumMicroscopymovie capturemultitouch interfacenotebookopticsPCpersonal electronic mediaProductsqualitative analysisquantitative analysisscanning electron microscopeSDDSEMSensors & Detectorssilicon drift detectorTest & Measurementturbo pumpwireless

Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
X
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to JEOL USA Inc. so they may respond to your inquiry directly.

Email Address:
Name:
Company:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.