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SIMS/SNMS Workstation

Photonics Spectra
Nov 2010
Hiden Analytical Ltd.Request Info
Hiden Analytical Ltd. has upgraded its SIMS/SNMS (secondary ion mass spectrometry/sputtered neutral mass spectrometry) workstation for high-sensitivity static and dynamic surface analysis. Applications range from photovoltaics, metallurgy, semiconductors and thin-film studies to geology and gemstone characterization. The sample loading and sample transfer stages with fast-entry load lock enable preloading and reloading of multiple samples for optimum cost-effective operational efficiency. The system is fully ultrahigh-vacuum-compliant, and with oxygen, argon and cesium ion sources, provides for broad-beam applications and fine-focus operation to a 20-μm spot size. It also offers elemental analysis of both electropositive and electro-negative species. Included in the system are electron beam charge compensation, a CCD camera and an enclosure. The multiported vacuum chamber is fully accessible for mounting additional accessories.


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argonbroad-beam applicationcamerasCCDCCD cameracesium ionelectron beam charge compensationelectronegative specieselectropositive speciesenclosurefine-focus operationgemstone characterizationgeologyHiden AnalyticalHiden Analytical Ltd.imagingion mass spectrometryload lockmass spectrometrymetallurgymountingNew ProductsoxygenphotovoltaicspreloadingPVsample loadingsample transfer stagesecondary ion mass spectrometry/sputtered neutral mass spectrometrysemiconductorsSIMS/SNMS workstationspectrometryspectroscopysurface analysisTest & Measurementthin-film studiesvacuum chambervacuum compliantworkstation

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