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New Interferometer for Dynamic Metrology

Photonics Showcase
Mar 2011Zygo CorporationRequest Info
 
DynaFiz™ is a new instantaneous Fizeau-type interferometer optimized for dynamic metrology in the presence of extreme vibrations and air turbulence. The light, efficient design offers fast shutter rates to freeze disturbances, and high spatial resolution for enhanced surface characterization. MetroPro™X enables real-time Zernike analysis for dynamic testing of optical systems.

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