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Optical Table Isolation System

Photonics.com
Jun 2011
Kinetic Systems Inc.Request Info
 
BOSTON, June 9, 2011 — Kinetic Systems Inc. has designed a versatile ultralow-natural-frequency optical table isolation support system.

Because of its Minus K negative-stiffness technology, the MK52 achieves low net vertical natural frequency without limiting its ability to support static loads. Horizontal isolation is provided by beam columns connected in series with the vertical-motion isolator. When adjusted to a ½-Hz natural frequency, the system achieves 93% isolation efficiency at 2 Hz, 99% at 5 Hz and 99.7% at 10 Hz.

It can be configured for a variety of locations and applications, wherever external vibrations can adversely affect the operation of sensitive equipment. Ultralow natural frequencies, high internal structural frequencies, and good vertical and horizontal isolation efficiencies make the system well suited to applications such as analytical balances, cell injection, confocal microscopes, patch clamping, optical microscopes, wafer probing, sensor calibration, and laser applications in semiconductor processing, telecommunications, aerospace engineering and medical research.

It also is suitable for applications requiring high resolution, such as Raman spectroscopy, atomic force microscopy (AFM), AFM-Raman integration and microhardness testing.

Available in table sizes up to 4 × 8 in., with gross load capacities up to 2000 lb, the tables are constructed with a 3/16-in.-thick ferromagnetic stainless steel top skin, a 3/16-in.-thick carbon steel bottom skin and a plated-steel precision honeycomb core.

Options include seismic restraints, retractable casters, auxiliary work surfaces and tabletop enclosures.


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aerospace engineeringAFM-Raman integrationAmericasanalytical balancesatomic force microscopyauxiliary work surfacesBasic Sciencebeam columnscarbon steelcell injectionCommunicationsconfocal microscopesferromagnetichoneycomb coreKinetic Systemslaser applicationsMassachusettsmedical researchmicrohardness testingMicroscopyMinus KMK52negative stiffnessoptical microscopesoptical table isolation systempatch clampingplated steelProductsRaman spectroscopyretractable castersseismic restraintssemiconductor processingsensor calibrationSensors & Detectorsstainless steeltabletop enclosurestelecommunicationsTest & Measurementvertical-motion isolatorwafer probing

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