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Fast-Scanning MultiMode AFM

Photonics.com
Jul 2011
Bruker Nano SurfacesRequest Info
 
SANTA BARBARA, Calif., July 27, 2011 — Bruker Corp. has announced fast scanning capabilities for the MultiMode 8 atomic force microscope (AFM). The system’s new ScanAsyst-HR feature provides a direct sixfold increase in imaging rate for improved research productivity.

This development leverages the company’s exclusive ScanAsyst imaging mode, which provides ease of use. It also provides fast scanning capabilities on the Dimension FastScan.

Adding ScanAsyst-HR makes the high resolution and performance of the microscopes available at scan rates six times faster than conventional scan rates and enables up to 20 times faster survey scanning.

ScanAsyst-HR on the MultiMode 8 makes faster AFM imaging accessible to a broader segment of the AFM research market and provides an upgrade path for existing users of older MultiMode atomic force microscopes. This is the latest in a series of enhancements to the MultiMode platform, which include proprietary new PeakForce QNM and PeakForce TUNA modes for quantitative nanomechanical and nanoelectrical characterization to support energy storage and energy generation research applications.


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Americasatomic force microscopesBasic ScienceBrukerCaliforniaDimension stScan AFMenergy generation research applicationsenergy storage research applicationsfast scanning for MultiMode 8 AFMimagingMicroscopyopticsPeakForce QNM modePeakForce TUNA modeProductsquantitative nanoelectrical characterizationquantitative nanomechanical characterizationScanAsyst-HR imaging mode

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