Laser Scanning Microscopes
Keyence Corp.Request Info
The VK-X series 3-D laser scanning microscopes from Keyence Corp.
of America combine the capabilities of scanning electron microscopes and noncontact
roughness gauges with the simplicity of an optical microscope. The systems deliver
0.5-nm Z-axis resolution with a magnification range from 200x to 24,000x. Ease of
use has been improved with the addition of the AI-Scan function, allowing users
to image and measure a target with a click of the mouse. With high-resolution color
imaging and nanometer-level profile measurement functions, the microscopes have
been designed to overcome the inadequacies of conventional imaging and profiling
technologies. A short-wavelength laser scans across a target to provide noncontact
profile, roughness and thickness measurements, even on targets with highly angular
surfaces.
https://www.keyence.com
/Buyers_Guide/Keyence_Corp/c7607
Published: September 2011
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