Search
Menu
Zurich Instruments AG - Boost Your Optics 1-24 LB

Sensor System

Armstrong Optical Ltd.Request Info
 
Facebook X LinkedIn Email
A noncontact high-precision sensor that provides thickness measurement of infrared silicon and other semi-conductor substrate wafers, doped or undoped, has been unveiled by Precitec Optronik and is available through Armstrong Optical Ltd. The CHRocodile IT sensor system is based on laser diode technology and offers thickness measurement in the range from 18 µm to 3 mm in air, with a resolution of better than 60 nm for silicon. It performs in-line measurements at a 4-kHz sampling rate and can operate in a vacuum. Measurement is independent of variations in temperature and atmospheric moisture, making the system suitable for industrial applications. The easily integrated sensor head comprises a passive lens system with no electronic components or moving parts.


Published: October 2011
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Armstrong Optical Ltd. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

Armstrong OpticalCHRocodile IT sensor systemdoped wafer thickness measurementEnglandEuropein-line wafer thickness measurementindustrialinfrared silicon wafer thickness measurementNew Productsnoncontact thickness measurementpassive lens systemPrecitec Optroniksemiconductor substrate wafer thickness measurementSensors & DetectorsTest & Measurementundoped wafer thickness measurement

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.