Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

MiniFlex Benchtop XRD Instrument

Photonics.com
Jan 2012
Rigaku Americas Corp.
 
THE WOODLANDS, Texas, Jan. 17, 2012 — Rigaku Corp. has announced additions to its MiniFlex series benchtop x-ray diffraction (XRD) analyzers. The fifth-generation MiniFlex is a general-purpose x-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials.

It is now available in two variations. Operating at 600 W (x-ray tube), the MiniFlex 600 is twice as powerful as other benchtop models, the company says, enabling faster analysis and improved overall throughput. Running at 300 W (x-ray tube), the MiniFlex 300 does not require an external heat exchanger and thus requires even less space. Each model is engineered to maximize flexibility in a benchtop package.

Suited for today’s fast-paced XRD analyses, the new instruments deliver speed and sensitivity through technology enhancements such as the optional D/teX high-speed detector coupled with the new 600-W x-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. Incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, the instruments have an available sample changer. Whether teaching x-ray diffraction at the college and university level, or performing routine industrial quality assurance, the MiniFlex delivers performance and value.

Each device is supplied standard with the latest version of PDXL, the company’s full-function powder diffraction analysis package. The latest version of PDXL offers a fundamental parameter method for more accurate peak calculation and for phase identification using the crystallography open database; it also provides a wizard for ab inito crystal structure analysis.


MORE FROM PHOTONICS MEDIA
Test & Measurement
Sensors & Detectors
Americasbenchtop x-ray diffraction analyzersindustrialMiniFlexMiniFlex 300 XRD instrumentMiniFlex 600 x-ray diffraction analyzerProductsqualitative analysis polycrystalline materialsquantitative analysis polycrystalline materialsRigakuSensors & Detectorsteach x-ray diffractionTest & MeasurementTexasx-ray diffraction analyzer crystallography open databasex-ray diffraction analyzer D/teX detectorx-ray diffraction analyzer graphite monochromatorx-ray diffraction analyzer peak calculationx-ray diffraction analyzer phase identificationx-ray diffraction analyzer sample changerx-ray diffraction analyzer scintillation counterx-ray diffraction analyzer wizard ab inito crystal structure analysisx-ray diffraction analyzers PDXL powder diffraction analysisx-ray diffractometerXRD analyzers

Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.