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Negative-Stiffness Optical Table

Photonics Spectra
Sep 2012
Minus K Technology Inc.Request Info
INGLEWOOD, Calif., Feb. 7, 2012 — In collaboration with Kinetic Systems Inc., Minus K Technology has released an ultralow natural frequency optical table isolation system for Raman spectroscopy, atomic force microscopy (AFM), AFM-Raman integration and microhardness testing.

The MK52 negative-stiffness table achieves 0.5 Hz or lower vertical and horizontal natural frequencies without limiting its ability to support static loads. When adjusted to a 0.5-Hz natural frequency, the MK52 achieves 93 percent isolation efficiency at 2 Hz, 99 percent at 5 Hz and 99.7 percent at 10 Hz.

The table, which can be configured for a variety of locations and applications, is available in sizes up to 4 × 8 ft with gloss load capacities up to 2000 lb. They are constructed with a 3/16-in.-thick ferromagnetic stainless steel top skin, 3/16-in.-thick carbon steel bottom skin and plated-steel precision honeycomb core. Customization options are available, including monitor stands, Faraday Cages, seismic restraints, tabletop enclosures to protect against harsh manufacturing environments, and nonisolated shelves for supporting equipment off the tabletop.

It also is suitable for applications wherever external vibrations can adversely affect the operation of sensitive equipment. These include cell injection, confocal and optical microscopes, wafer probing, sensor calibration and laser applications in fields such as semiconductor processing, aerospace engineering, medical research and telecommunications.


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aerospace engineeringAFMAFM-Raman integrationAmericasatomic force microscopyBasic ScienceBiophotonicsBreakthroughProductsCaliforniacell injectionCommunicationsFaraday Cagesharsh manufacturing environmentsindustrialKinetic Systemslasersmedical researchmicrohardness testingmicroscopesMicroscopyMinus K TechnologyMK52 optical tablenegative-stiffness optical tableNew Productsoptical table isolation systemopticsProductsRaman spectroscopysemiconductor processingsensor calibrationSensors & DetectorstelecommunicationsTest & Measurementwafer probingWafers

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