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QI for AFM System

Mar 2012
JPK Instruments AGRequest Info
JPK Instruments has announced new quantitative imaging (QI) capabilities for the recently launched NanoWizard 3 atomic force microscopy (AFM) system. The QI mode was developed by the company to facilitate AFM imaging. With QI, a force curve-based imaging mode, the user has full control over the tip-sample force at every pixel of the image. There is no need for set point or gain adjustment while scanning. Applying proprietary ForceWatch technology, QI delivers good results on soft (hydrogels or biomolecules), sticky (polymers or bacteria), loosely attached (nanotubes or virus particles in fluid) samples, or on samples with steep edges (powders, microelectromechanical systems structures). It is useful in areas that demand high resolution and force sensitivity, such as biology, polymers and surface science.


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Basic ScienceBiophotonicsBreakthroughProductsEuropeforce curve-based imaging modeForceWatch technologyGermanyimagingJPK InstrumentsMicroscopynanoNanoWizard 3 atomic force microscopeNew ProductsopticsProduct PreviewQI for NanoWizard 3 AFMQI-Advanced software packageQuantitative Imagingquantitative imaging bacteriaquantitative imaging biomoleculesquantitative imaging hydrogelsquantitative imaging MEMSquantitative imaging microelectromechanical systems structuresquantitative imaging nanotubesquantitative imaging polymersquantitative imaging powdersquantitative imaging real quantitative dataquantitative imaging virus particles in fluidquantitative measurement material adhesionquantitative measurement material dissipationquantitative measurement material stiffness

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