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TERS-Ready AFM System

Feb 2012
Bruker Nano SurfacesRequest Info
Bruker Corp.’s Nano Surfaces Div. has introduced the Innova-IRIS integrated system for correlated atomic force microscopy (AFM) and Raman spectroscopic imaging. Its ultralow closed-loop noise, no-drift mechanical stability and wide-open optical access make it suitable for tip-enhanced Raman spectroscopy (TERS) research. With hardware integration designed to accelerate a TERS setup, and an IRIS software module that offers automated mapping, the system transforms AFM and Raman instruments into TERS-enabled research platforms. The Innova-IRIS system provides a solution for routinely correlating AFM nanoscale property maps with Raman chemical images to address nanoscale materials analysis applications. It leverages the performance and AFM head design of the Innova platform to provide TERS-ready AFM-Raman integration suitable for sensitive interrogation of opaque samples. It is compatible with leading Raman systems.


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AFM and Raman combinationAFM nanoscale property mapsAmericasArizonaatomic force microscopy and Raman spectroscopic imaging systemBasic ScienceBiophotonicsBreakthroughProductsBrukerInnova-IRISinterrogate opaque samplesMicroscopynanonanoscale materials analysisopticsRaman chemical imagesTERSTest & Measurementtip-enhanced Raman spectroscopy

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