OPTICAL METROLOGY TOOL
AMO WaveFront Sciences LLCRequest Info
WaveFront Sciences Inc. has introduced the Complete Light Analysis
System - 2D, which provides quantitative measurements of both the
intensity and phase of any optical source. This vibration-insensitive
optical metrology tool is a low-cost baseline system with <l/100
resolution and >100-µm dynamic range. It is a complete, turnkey
optical analysis system. Applications include beam profiling, quality
control testing and screening, and on-line inspection. A portable
version is also available.
http://www.wavefrontsciences.com
/Buyers_Guide/AMO_WaveFront_Sciences_LLC/c15975
Published: April 1997
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