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MF/MF-U Generation D Measuring Microscopes
Jan 2013
Mitutoyo America Corp.Request Info
AURORA, Ill., Jan. 10, 2013 — Mitutoyo America Corp. has released generation D MF/MF-U measuring microscopes that offer long-working-distance objectives and submicron-accuracy glass scales.

Features include three-axis, motor-driven positioning with variable speed joystick control and collision prevention (Z-axis) to reduce operator fatigue and increase accuracy. The motorized X-, Y- and Z-axis motor functions can be combined with a new Mitutoyo vision unit to produce new levels of automation in toolmaker microscopes.

Laser Auto-Focus models provide high accuracy and repeatability in two modes of operation: Just Focus for quick focusing and Tracking Focus for maintaining focus as the stage moves.

Available optical options include magnification levels, bright-field/dark-field and LED illumination. High repeatability and productivity make the microscope suitable for measurement of cutting tools, molds and other machined components. Semiconductor wafer holders specific to the generation D MF/MF-U measuring microscope are available.

The microscopes support output to measurement data applications such as the proprietary MeasurLink statistical-processing and process-control program, which performs statistical analysis and provides real-time display of measurement results. The program also can be linked to a higher-level network environment for enterprisewide functionality.


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Americascollision preventionIllinoisindustrialJust FocusLaser Auto-Focuslong-working-distance objectivesmeasure cutting toolsmeasure machined componentsmeasure moldsmeasuring microscopesMeasurLinkMF/MF-UMicroscopyMitutoyo Americamotor-driven positioningopticsProductssemiconductor wafer holderssubmicron-accuracy glass scalesTest & Measurementthree-axis positioningtoolmaker microscopesTracking Focusvariable speed joystickWafers

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