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Enhanced OptiTrace 5000 Optics Manufacturing Software

Photonics.com
May 2013
OptiPro SystemsRequest Info
 
ONTARIO, N.Y., May 24, 2013 — OptiPro Systems LLC has enhanced the capabilities of its OptiTrace 5000 aspheric profilometer data analysis software to include multiple-profile loading and 3-D surface reconstruction.

The multiple-profile loading feature enables multiple traces from the same optic to be incorporated into one plot, allowing iterative correction attempts to be overlaid; the result allows the operator to see where and how the optic is changing. Understanding the progression of optics after each correction run will help optical companies further optimize their fabrication processes.

With the reconstruction tool, the operator can create a 3-D surface error map using a 2-D contact profilometer, which can now focus on both asymmetric and symmetric rotational errors. The user takes the desired number of scans in a bicycle-wheel-spoke pattern around the optic, rotating it at specific intervals. The algorithm analyzes the data traces and the angles from which they were taken to produce the 3-D surface error map, which can be exported to a variety of common formats for deterministic correction.


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2-D contact profilometer3-D surface reconstructionAmericasaspheric profilometer data analysis softwareopticsOptiPro Systems LLCOptiTrace 5000ProductsTest & Measurement

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