Search
Menu
DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Helios NanoLab 660 DualBeam

FEI Life Sciences (acquired by Thermo Fisher)
 
Facebook X LinkedIn Email
HILLSBORO, Ore., July 2, 2013 — FEI’s Helios NanoLab 660 DualBeam system provides scanning electron microscopy imaging in combination with focused ion beam milling for materials science research.

Applications include investigating the structure and function of materials at the nanoscale, creating prototypes of micro- and nanoelectromechanical systems, and preparing ultrathin samples for atomic-scale imaging and analysis in a transmission electron microscope.

The device uses proprietary electron optical and detector technologies to deliver subnanometer imaging resolution with high signal collection efficiency and high contrast over a 0.5- to 30-kV range of accelerating voltages.

It is suitable for high-resolution imaging of surfaces, sections or volumes in a variety of materials, especially soft or delicate samples such as carbon nanotubes, polymers, ceramics and catalysts. The company says that its performance at low accelerating voltages reduces beam damage and improves sensitivity to surface detail.


Published: July 2013
Photonics Marketplace
Looking for Ceramics? There are 49 companies listed in the Photonics Buyers' Guide.
Browse Cameras & Imaging, Lasers, Optical Components, Test & Measurement, and more.
3-D imagingAmericasBasic Scienceelectron optical and detector technologiesFEIfocused ion beam millingHelios NanoLab 660 DualBeamImagingmaterials researchMicroscopynanoOpticsOregonProductsscanning electron microscopySensors & Detectors

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.