Search
Menu
DataRay Inc. - ISO 11146-Compliant Laser Beam Profilers

Optical Metrology System

FormFactorRequest Info
 
Facebook X LinkedIn Email
Optical Metrology SystemFRT Fries Research & Technology GmbH has announced the MicroProf 100 optical metrology system with multisensor technology.

Point and area sensor integration allows the investigation of a range of surfaces from smooth to rough and matte to transparent. Depending on the dimensions, up to three sensors and a camera can be installed.

The MicroProf 100 can be extended for double-sided sample inspection and determining sample thickness during the same measurement process. The XY table travel range is 150 × 100 mm, suitable for the individual measurement of small parts in tray during production. The tabletop system can also be used in R&D labs.


Published: September 2015
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to FormFactor by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsTest & MeasurementMicroProf 100metrologyFries Research & TechnologyFRTGermanyEurope

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.