Request InfoNanonics Imaging Ltd.The NSOM/AFM-100 is a confocal micro-optical profiler that performs beam profiling and characterization for optical component inspection applications. This system from Nanonics Imaging Ltd. utilizes a cantilevered optical fiber probe that scans the microlensed fiber and simultaneously measures the topography of the lens and collects light at each point in the scan with a resolution down to 50 nm. The profiler monitors the distribution of light at various optical planes in micron or submicron steps from above the fiber tip to the focal point.See full productRelated content from Photonics MediaPRODUCTSPhotonics.com 4/27/2022Longwave IR CamerasThe Ceres V 640 and Ceres V 1280 from Xenics BV are high-performance, longwave IR cameras that expand thermal imaging, sensing, and thermographic applications. 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