Request InfoMKS Instruments Inc.The Spectra Vision 1000-C and -E in situ process monitoring systems from MKS Instruments Inc. continuously collect and interpret data from chemical vapor deposition process tools and etch tools using a closed ion source analyzer and a close-coupled automated inlet. The Unibloc inlet valve automates the sampling of background and process gases with the recipe-driven software. The valve and analyzer are automatically isolated from the process chamber and purged with inert gas to keep the source clean when the systems are not sampling.See full productRelated content from Photonics MediaWEBINARSPhotonics.com 7/22/2021STANDARDS UPDATE: Vision Standards: An Overview of Global and A3 DevelopmentsStandards play a key role in the vision and imaging industry by ensuring interoperability of components, increasing market size, and shortening the time it takes to get new products to market. As the...Photonics.com 1/12/2023A Proven, Portable, and PIC-Based Methodology for Cultivating a Next-Generation WorkforceWith the passage of the CHIPS and Science Act and growing demand for photonic integrated circuit technology, the semiconductor industry is once again gaining momentum. But even as the U.S. rebuilds...Photonics.com 3/7/2019In Vivo Medical Laser Procedures: An OverviewThis webinar, presented by OFS, will provide an overview of current in vivo medical procedures performed using lasers and optical fibers. The presentation will begin with a brief history of...Photonics.com 3/27/2024Precision Planning: Simplified Laser Scanning with Predictive SoftwareConventional controllers for laser scan systems do not allow to predict the actual path of the laser beam on the work piece. A tedious process of testing different parameters and delay settings...